MIT.nano receives grant to acquire focused ion beam scanning electron microscope

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The VELION FIB-SEM, a next-generation dual-beam nanofabrication platform located in MIT.nano, will become a permanent part of the facility’s characterization capabilities, thanks in part to a Major Research Instrumentation (MRI) award from the U.S. National Science Foundation (NSF). A team of MIT researchers led by James LeBeau, the John Chipman Associate Professor of Materials Science and […]